Study of the Structure of Chemically Gradient Thin Films
Thin films prepared with a compositional gradient represent a materials library suitable for studying structure formation and measuring material properties across a wide range of chemical compositions. The motivation for obtaining the structural composition of the materials library is the applicability of the thin film on a polyimide substrate for flexible electronics. Structural analysis was carried out using photon diffraction in transmission mode at the synchrotron radiation source on beamline ID-22 at ESRF, with micro-focusing of the beam to 0.5 x 0.5 mm² to ensure local characterization.
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